Borque, M. J., A. M. Ruiz, J. L. García y M. Crespo (2003). Prácticas de Topometría. Servicio de Publicaciones e Intercambio Científico. Universidad de Jaén. (528.4 BOR pra).
Atención, dado que este cuaderno está siendo revisado por el profesorado, se dejará en copistería progresivamente a lo largo del cuatrimestre.
Chueca, M., J. Herráez y J. L. Berné (1996). Tratado de Topografía 2. Métodos topográficos. Paraninfo. Madrid. (528.4 CHU met)
Ghilani, C.D.; Wolf, P.R. (2006). Adjustment computations. Spatial data analysis. 4th Ed. John Wiley & Sons. New Jersey. 611 pp.
Ghilani, C.D.; Wolf, P.R. (2008). Elementary surveying. An introduction to Geomatics. 12th Ed. Prentice Hall. New Jersey.
International Organization for Standardization (2001). International Standard ISO 17123-1: 2001. Optics and optical instruments – Field procedures for testing geodetic and surveying instruments – Part 1: Theory. International Organization for Standardization
International Organization for Standardization (2001). International Standard ISO 17123-2: 2001. Optics and optical instruments – Field procedures for testing geodetic and surveying instruments – Part 2: Levels. International Organization for Standardization.
International Organization for Standardization (2001). International Standard ISO 17123-3: 2001. Optics and optical instruments – Field procedures for testing geodetic and surveying instruments – Part 3: Theodolites. International Organization for Standardization.
International Organization for Standardization (2001). International Standard ISO 17123-4: 2001. Optics and optical instruments – Field procedures for testing geodetic and surveying instruments – Part 4: Electro-optical distance meters (EDM instruments). International Standardization Organization.
Kirkup, L.; Frenkel, B. (2006). An introduction to Uncertainty in Measurement. Cambridge, UK: Cambridge University Press.
Ojeda, J. L. (1984). Métodos topográficos y oficina técnica. Autor editor. Madrid.
Perruchet, C.; Priel, M. (2001). Estimación de la incertidumbre. Medidas y ensayos. Madrid: AENOR.